Systems and methods for refining estimated effects of parameters on amplitudes
US10670755B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 2, 2018 |
| Grant date | Jun 2, 2020 |
| Priority date | — |
| Expiry date | Feb 7, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/74
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for refining estimated effects of parameters on amplitudes are disclosed. Exemplary implementations may: (a) obtain ranges of parameter values for individual parameters within a subsurface region of interest; (b) generate a first model of the subsurface region of interest; (c) calculate a synthetic seismogram from the first model to determine corresponding amplitudes; (d) store results of applying the synthetic seismogram; (e) repeat steps (b)-(d) for multiple additional models; (f) obtain a subsurface distribution; (g) apply the subsurface distribution to the multiple models and the corresponding amplitudes; (h) generate a representation; and (i) display the representation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.