Patent · US Active

Systems and methods for refining estimated effects of parameters on amplitudes

US10670755B2 · kind B2 · utility

0Cited by
1References
20Claims
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Key dates

Filing dateApr 2, 2018
Grant dateJun 2, 2020
Priority date
Expiry dateFeb 7, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V2210/74
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems and methods for refining estimated effects of parameters on amplitudes are disclosed. Exemplary implementations may: (a) obtain ranges of parameter values for individual parameters within a subsurface region of interest; (b) generate a first model of the subsurface region of interest; (c) calculate a synthetic seismogram from the first model to determine corresponding amplitudes; (d) store results of applying the synthetic seismogram; (e) repeat steps (b)-(d) for multiple additional models; (f) obtain a subsurface distribution; (g) apply the subsurface distribution to the multiple models and the corresponding amplitudes; (h) generate a representation; and (i) display the representation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.