Method and apparatus for detecting surface features
US10672118B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2017 |
| Grant date | Jun 2, 2020 |
| Priority date | — |
| Expiry date | Apr 11, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/50
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for detecting a feature on a surface. A mesh comprising a plurality of mesh elements is generated using surface data generated for a surface region. The plurality of normal vectors is computed for the plurality of mesh elements. A distribution for the plurality of normal vectors is generated. A dominant subset of the plurality of mesh elements is identified in which a Z component of a corresponding normal vector for each mesh element of the dominant subset is in substantially a first direction. Z components of a portion of the plurality of normal vectors corresponding to a remaining subset of the plurality of mesh elements are analyzed to determine whether the feature is present within the surface region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.