Electronic test structures for one or more magnetoresistive elements, and related methods
US10672423B2 · kind B2 · utility
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11References
14Claims
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Key dates
| Filing date | Apr 10, 2018 |
| Grant date | Jun 2, 2020 |
| Priority date | — |
| Expiry date | Jun 9, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/3903
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure involves electronic test structures, and related methods, for use with one or more magnetoresistive elements at least at the wafer stage of slider manufacturing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.