Levelness measuring device and levelness measuring method
US10677578B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 12, 2018 |
| Grant date | Jun 9, 2020 |
| Priority date | — |
| Expiry date | Dec 26, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F17/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A levelness measuring system can be applied to a levelness measuring device, the device including an rail, a distance detector, and an angle detector. Both the distance detector and the angle detector are installed on the rail. The system includes a coordinate system establishing module, a distance measurement controlling module, a data fitting module, a plane equation calculating module, a first angle calculating module, an angle measurement controlling module, a second angle calculating module, and a display controlling module. A coordinate system in three dimensions is applied to an inaccessible or difficult surface such that direct contact is not required. A processor of a computer performs instructions to provide the functions of the levelness measuring system including a display.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.