Testing of device sensors on a manufacturing line
US10677618B2 · kind B2 · utility
0Cited by
2References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 4, 2016 |
| Grant date | Jun 9, 2020 |
| Priority date | — |
| Expiry date | Sep 29, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D21/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.