Scanning infrared measurement system
US10677710B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 29, 2018 |
| Grant date | Jun 9, 2020 |
| Priority date | — |
| Expiry date | Nov 29, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the a fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.