Systems and methods for inspection and defect detection
US10677740B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2019 |
| Grant date | Jun 9, 2020 |
| Priority date | — |
| Expiry date | Nov 1, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting an article with a defect detection tool includes receiving one or more articles at an inspection station and inspecting one of the received one or more articles at the inspection station by evaluating the article for at least one physical defect with the defect detection tool. The defect detection tool includes a clear body including a surface element sized to correspond to the at least one physical defect in the article, the surface element including at least one of a linear element or a circular element and an inspection surface configured to contact a surface of the article when the clear body is applied to the article. Evaluating the article for at least one physical defect with the defect detection tool includes applying the defect detection tool against the article to align the surface element with a potential physical defect in the surface of the article and determining that the at least one physical defect is present when the potential physical defect has a size equal to or larger than a size of the linear element or a size of the circular element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.