Measurement apparatus, system, and method for obtaining conductivity measurements of a surface of a structure
US10677746B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 18, 2017 |
| Grant date | Jun 9, 2020 |
| Priority date | — |
| Expiry date | Jun 7, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is provided a measurement apparatus for obtaining conductivity measurements of a surface of a structure. The apparatus has a housing, and a pair of support legs depending from the housing. Each support leg has a first end, wherein the first ends define a support leg plane. The apparatus has a pair of conductive measurement probes slidably disposed between the support legs, and at least one force applying member coupled to the housing. The at least one force applying member applies a biasing force to cause the pair of conductive measurement probes to extend a predetermined distance beyond the support leg plane. A downward applied force applied to the housing, when the conductive measurement probes are in contact with the surface, causes a displacement of the conductive measurement probes, until the first ends of the support legs contact the surface. Conductivity measurements between the conductive measurement probes are consistently obtained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.