Patent · US Active

Facilitating targeted analysis via graph generation based on an influencing parameter

US10678823B2 · kind B2 · utility

1Cited by
13References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 15, 2016
Grant dateJun 9, 2020
Priority date
Expiry dateMar 16, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N20/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Provided is a process including: obtaining a graph comprising nodes and edges, each of the edges having a value indicating an amount of similarity between objects corresponding to the two linked nodes; selecting a parameter for influencing the graph; assessing each of the nodes based on the selected influencing parameter, wherein assessing comprises, with respect to each adjacent node in the graph sharing an edge with the node: determining the value indicating the amount of similarity between the object corresponding to the node and the object corresponding to the adjacent node; and determining a score related to the edge shared with the node, the score determined based on the similarity-amount value and a value of the selected influencing parameter for the node, such that edges are removed, weakened, added, or strengthened; and preparing, based on the graph, instructions to display at least part of the graph.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.