Patent · US Active

Method to determine support costs associated with specific defects

US10679295B1 · kind B1 · utility

0Cited by
1References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 2016
Grant dateJun 9, 2020
Priority date
Expiry dateAug 1, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F16/242
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Case analysis is provided in which costs are associated with case information such as service request data. A description of defect classifications may be defined using keywords and attributes. A database query is generated based on the description of defect classifications to classify case information by problem type to a domain and a component. The description of defect classifications may be applied to a result of the database query to perform problem classification analysis. A cost analysis may be performed by problem group based at least on the case information associated with cost information and the result of the database SQL query.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.