Patent · US Active

Debugging method and device for operating point voltage of parallel MZI electro-opticalmodulator

US10680709B2 · kind B2 · utility

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5References
9Claims
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Assignee

Inventors

Key dates

Filing dateDec 19, 2016
Grant dateJun 9, 2020
Priority date
Expiry dateDec 19, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B10/564
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A debugging method and device for an operating point voltage of a parallel MZI electro-optical modulator. The parallel MZI electro-optical modulator comprises a Parent MZI (2) formed by a parallel connection of a Child MZI (3) in an I path and a Child MZI (4) in a Q path. The debugging method comprises: fixing a bias voltage of one Child MZI of the Child MZI (3) in the I path and the Child MZI (4) in the Q path; gradually adjusting a bias voltage of the other Child MZI, testing a parent extinction ratio PER of the Parent MZI (2) when different bias voltages are applied, and finding a corresponding bias voltage as an operating point voltage of the other Child MZI when the PER of the Parent MZI (2) reaches a minimum value, and then finding a corresponding bias voltage as an operating point voltage of the one Child MZI when the PER of the Parent MZI (2) reaches a minimum value; setting the bias voltages of two Child MZIs as operating point voltages corresponding to the two Child MZIs respectively, adjusting a phase modulation voltage of the Parent MZI (2) until the parallel MZI electro-optical modulator reaches an optimum output effect, and determining the phase modulation voltage of …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.