Misalignment compensation in dual X-ray imager
US10682116B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 27, 2017 |
| Grant date | Jun 16, 2020 |
| Priority date | — |
| Expiry date | Dec 20, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/8057
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An X-ray sensing apparatus includes a first photodiode array for imaging a first area, a second photodiode array for imaging a second area that overlaps a portion of the first area, and a light-blocking layer coupled to the first photodiode array that prevents at least a portion of visible light emitted by a scintillator layer of the X-ray sensing apparatus from reaching the second photodiode array. The light-blocking layer includes a first feature that is imagable by the second photodiode array and indicates a position along a first direction and a second feature that is imagable by the second photodiode array and indicates a position along a second direction that is different than the first direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.