Method and scanning fluorescence microscope for multi-dimensional high-resolution imaging a structure or a path of a particle in a sample

US10684225B2 · kind B2 · utility

Assignee

• Laser-Laboratorium Göttingen E.V. · DE

Inventors

• Alexander Egner · Einbeck, DE
• Claudia Geisler · Bad Gandersheim, DE
• Jennifer-Rose Krueger · Munster, DE

Key dates

• Filing date: Oct 2, 2017
• Grant date: Jun 16, 2020
• Expiry date: Sep 4, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B27/58
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

For multi-dimensional high-resolution imaging a structure marked with fluorescence markers, fluorescence enabling light is focused to illuminate a measurement area in a sample. A partial area of the measurement area is subjected to fluorescence inhibiting light. The partial area omits a center of the measurement area in that an intensity distribution of the fluorescence inhibiting light comprises a line-shaped intensity minimum. A minimal extension of the intensity minimum in a direction through the center area is by a factor k≥2 smaller than a diameter of the measurement area in said direction. Without spatial resolution, fluorescence light emitted out of the measurement area is measured for a plurality of consecutive angle positions of the intensity minimum about the center, while the measurement area, for each angle position, is subjected to the fluorescence enabling light. A value of the measured fluorescence light is assigned to the position of the center.