Tuning a testing apparatus for measuring skew
US10684319B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2015 |
| Grant date | Jun 16, 2020 |
| Priority date | — |
| Expiry date | May 28, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3191
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments herein discuss tuning a testing apparatus to better match the input response of a target system in which a cable will be used. For example, conductors in the cable may have a different skew depending on the system in which they are used. The testing apparatus may be tuned using frequency information regarding the type of signals that will be driven on the cable when installed in the target system. In one embodiment, the testing apparatus adjusts a testing cycle refresh rate for generating a testing signal which changes the frequency content of the testing signal. Using the adjusted testing cycle refresh rate results in the driver outputting a testing signal that better reflects the actual signals that will be transmitted on the cable in the target system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.