IC device authentication using energy characterization
US10684324B1 · kind B1 · utility
0Cited by
4References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 13, 2019 |
| Grant date | Jun 16, 2020 |
| Priority date | — |
| Expiry date | Dec 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/73
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods, and apparatuses are described for verifying the authenticity of an integrated circuit device. An integrated test apparatus may use quiescent current and/or conducted electromagnetic interference readings to determine if a device under test matches the characteristics of an authenticated device. Deviations from the characteristics of the authenticated device may be indicative of a counterfeit device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.