Systems and methods for predicting errors and optimizing protocols in quantitative magnetic resonance imaging
US10684340B1 · kind B1 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 8, 2019 |
| Grant date | Jun 16, 2020 |
| Priority date | — |
| Expiry date | Jan 8, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/543
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A magnetic resonance imaging system and method are provided for improved determination of noise bias effects in calculating fitted parameters for quantitative MRI procedures. The system and method includes selecting a range for the SNR and fitted parameter values, and for each of a plurality of base pairs of these values and for a plurality of b values, adding a random noise term to the real and imaginary components of a plurality of corresponding signal terms, fitting magnitudes of the resulting “noisy” signals to determine a “noisy” fitted parameter value, and compare the “noisy” and base fitted parameter values to determine a noise-based error for each pair of base values. The noise-based errors can be used to generate an error map, modify imaging parameters to reduce such errors, or correct fitted parameters directly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.