Removable test and diagnostics circuit
US10684664B2 · kind B2 · utility
0Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2014 |
| Grant date | Jun 16, 2020 |
| Priority date | — |
| Expiry date | Oct 19, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/065
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test and diagnostics circuit, methods and systems are described. An example test and diagnostics circuit includes a controller and a power monitor coupled to the controller. A load switch on the test and diagnostics circuit selectably implements a load from among multiple load values to test a computing and/or data storage system. The test and diagnostics circuit includes circuitry connecting the controller, the power monitor and the load switch to receive a test enable signal from a non-dedicated pin in a non-volatile dual inline memory module (NV-DIMM) slot to implement a test operation on the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.