Deriving the shortest steps to reproduce a device failure condition
US10684935B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 16, 2018 |
| Grant date | Jun 16, 2020 |
| Priority date | — |
| Expiry date | Aug 2, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment, a server creates a reproduction environment of a particular condition of a particular device, the reproduction environment having a device under test (DUT) representative of the particular device, and also being seeded with features regarding the particular condition. The server generates a plurality of models for reaching a target state of the particular condition, each of the plurality of models having differing actions. According to the techniques herein, the server then iteratively refines a minimal model based on the actions of the plurality of models and whether those actions during testing of the DUT get closer to or further from the target state. In response to determining that the minimal model can no longer be further refined during the iterative refining, the server then stores the minimal model as a solution model indicating a given minimal set and order of actions required to reach the target state.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.