Measurement time distribution in referencing schemes
US10690591B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 29, 2016 |
| Grant date | Jun 23, 2020 |
| Priority date | — |
| Expiry date | May 26, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12776
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for measurement time distribution for referencing schemes are disclosed. The disclosed methods and systems can be capable of dynamically changing the measurement time distribution based on the sample signal, reference signal, noise levels, and SNR. The methods and systems can be configured with a plurality of measurement states, including a sample measurement state, reference measurement state, and dark measurement state. In some examples, the measurement time distribution scheme can be based on the operating wavelength, the measurement location at the sampling interface, and/or targeted SNR. Examples of the disclosure further include systems and methods for measuring the different measurement states concurrently. Moreover, the systems and methods can include a high-frequency detector to eliminate or reduce decorrelated noise fluctuations that can lower the SNR.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.