Super-resolution X-ray imaging method and apparatus
US10692184B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 2, 2018 |
| Grant date | Jun 23, 2020 |
| Priority date | — |
| Expiry date | Dec 1, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20221
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The presently-disclosed technology improves the resolution of an x-ray microscope so as to obtain super-resolution x-ray images having resolutions beyond the maximum normal resolution of the x-ray microscope. Furthermore, the disclosed technology provides for the rapid generation of the super-resolution x-ray images and so enables real-time super-resolution x-ray imaging for purposes of defect detection, for example. A method of super-resolution x-ray imaging using a super-resolving patch classifier is provided. In addition, a method of training the super-resolving patch classifier is disclosed. Other embodiments, aspects and features are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.