Self-calibrating base station for offset measurements
US10697820B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 2, 2018 |
| Grant date | Jun 30, 2020 |
| Priority date | — |
| Expiry date | Dec 18, 2038 |
Classification
- Technology area (CPC F)Mechanical Engineering; Lighting; Heating
- CPC primaryF17C2250/0426
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A self-calibrating system, apparatus, and method for accurately measuring a volumetric capacity of a tank. The system, apparatus and method comprise: a mechanism that adjusts a level of a platform; a light-emitting device with beam-like optics (laser, diode, etc.) mounted to the platform; mechanism for adjusting alignment of the light-emitting device with respect to the platform; a mechanism for rotating the platform by variable angles, including by 180-degrees; one or more level sensors (such as, for example, spirit levels, tilt sensors, or other devices) that provide feedback on the alignment of the platform normal to the gravity vector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.