Blended analog-to-digital conversion for digital test and measurement devices
US10698027B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2019 |
| Grant date | Jun 30, 2020 |
| Priority date | — |
| Expiry date | Nov 15, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/121
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Systems and methods are provided for blended analog-to-digital conversion for digital test and measurement devices. A first-frequency-domain circuit path is configured to generate a first processed digital signal having high fidelity to an analog signal over a first frequency domain. A second-frequency-domain circuit path is configured to generate a second processed digital signal having high fidelity to the analog signal over a second frequency domain. A blended digital signal is generated using the first processed digital signal and the second processed digital signal. The blended digital signal can have high fidelity to the analog signal over multiple frequency domains.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.