Testing leaking rays
US10698124B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 8, 2018 |
| Grant date | Jun 30, 2020 |
| Priority date | — |
| Expiry date | Jun 12, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/2985
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Devices and methods of testing leaking rays are provided. In one aspect, a device includes a first rotary arm configured to rotate around a first rotary axis, a second rotary arm rotatably connected with the first rotary arm and configured to rotate around a second rotary axis, a probe mounted on a rotating end of the second rotary arm and configured to measure a numerical value of leaking rays at each position at which the probe stays, a mounting base rotatably connected with the second rotary arm and configured to mount a ray source component, a first driving unit configured to drive the first rotary arm to rotate around the first rotary axis, and a second driving unit configured to drive the second rotary arm to rotate around the second rotary axis, the first rotary axis being perpendicular to the second rotary axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.