Method for detecting surface impurities by X-ray fluorescence analysis

US10705034B2 · kind B2 · utility

Assignee

• Airbus Defence and Space GmbH · DE

Inventors

• Sebastian Heckner · Munich, DE
• Georg Wachinger · Rosenheim, DE
• Thomas Meer · Egmating, DE
• Matthias Geistbeck · Mindelheim, DE

Key dates

• Filing date: Oct 28, 2016
• Grant date: Jul 7, 2020
• Expiry date: Jun 16, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/652
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for detecting surface impurities on a surface of a component by X-ray fluorescence analysis uses a hand spectroscope for application to the surface of a component. The hand spectroscope comprises an X-ray source, a fluorescent radiation detector, an analyzer and a display. The method comprises irradiating the surface of the component with X-rays using the X-ray source; detecting fluorescent radiation, which is emitted by the surface of the component as a result of the irradiation with the X-rays, using the fluorescent radiation detector; measuring a radiation spectrum of the detected fluorescent radiation; generating an evaluation result by analyzing the measured radiation spectrum using the analyzer, the evaluation result comprising a quantitative measure of the surface impurity of the surface due to predetermined characteristic substances; and outputting the generated evaluation result on the display.