Multi-dimensional approach to imaging, monitoring, or measuring systems and processes utilizing capacitance sensors
US10705043B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 31, 2017 |
| Grant date | Jul 7, 2020 |
| Priority date | — |
| Expiry date | Jun 19, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T11/003
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for imaging, monitoring, or measuring systems and processes utilizing only data provided from capacitance sensors. The present invention combines the multi-frequency method of both ECVT/AECVT and DCPT to image or measure processes and systems more efficiently and accurately than the methods alone. The present system analyzes capacitance and current phase acquired at multiple frequencies to determine a plurality of properties of single and multiphase systems all at once. The combined use of ECVT and DCPT in multiphase flow can also be extended to measure volume fraction and phase distribution of flows involving greater than three phases by using multiple frequencies for capacitance, current phase, or both.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.