Nondestructive inspection system
US10705243B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2019 |
| Grant date | Jul 7, 2020 |
| Priority date | — |
| Expiry date | Jan 24, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/106
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a nondestructive inspection system includes: a radiation source system generating different types of radiations and irradiating the generated different types of radiations toward an inspection object; a detector system detecting each of the radiations transmitted through the inspection object; a transfer system varying a position of the inspection object such that the radiations generated by the radiation source system are irradiated to the inspection object; and an image system generating an image regarding the inspection object on the basis of a detection result from the detector system, wherein the radiation source system comprises: an electron gun generating an electron beam; an electron accelerator accelerating the electron beam generated by the electron gun; and a target system selectively generating at least one of various types of radiations according to variables when the electron beam accelerated by the electron accelerator is irradiated thereto.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.