Testing for memories during mission mode self-test
US10706952B1 · kind B1 · utility
3Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 19, 2018 |
| Grant date | Jul 7, 2020 |
| Priority date | — |
| Expiry date | Aug 18, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0409
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods disclosed herein provide for efficiently testing memories during mission mode self-test (“MMST”) without destroying any original functional data. Embodiments provide for a converter to feed a manipulated version of the original functional data back into the tested memories. Embodiments further provide an accumulator to count the occurrences of correctable and uncorrectable errors associated with the tested memories.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.