Free space segment tester (FSST)
US10707585B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2019 |
| Grant date | Jul 7, 2020 |
| Priority date | — |
| Expiry date | Mar 29, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01Q3/267
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment. In one example, the TFT segment is used for integration into a flat panel antenna if the measured characteristic of the TFT segment indicates the TFT segment is acceptable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.