System and method for near-field measurement of a device under test in a far-field environment
US10707976B1 · kind B1 · utility
3Cited by
2References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 16, 2019 |
| Grant date | Jul 7, 2020 |
| Priority date | — |
| Expiry date | Aug 16, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/318
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A system for near-field measurement of a device under test in a far-field environment is provided. The system comprises a communication unit adapted to establish a far-field connection with the device under test. The system further comprises a measuring unit adapted to measure a magnitude and a phase of at least two field components. Moreover, the system comprises a processing unit adapted to perform far-field to near-field and/or near-field to near-field transformation of the field components in order to calculate field components at a specific surface in the near-field of the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.