Patent · US Active

Polishing compositions

US10711159B2 · kind B2 · utility

0Cited by
2References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 27, 2017
Grant dateJul 14, 2020
Priority date
Expiry dateDec 27, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/7684
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present disclosure provides chemical mechanical polishing compositions that achieve minimal dishing at reduced dishing reducer (DR) levels when compared to known CMP compositions. The compositions of the disclosure include a dynamic surface tension reducer (DSTR) which allows for lower levels of dishing reducer in the compositions. Indeed, the compositions of the disclosure allow for lower levels of dishing reducer to achieve the same dishing as known compositions having higher levels of dishing reducer. Deleterious effects of high DR levels are thereby avoided or minimized when employing the compositions of the disclosure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.