Inspection jig
US10712383B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 28, 2018 |
| Grant date | Jul 14, 2020 |
| Priority date | — |
| Expiry date | Nov 28, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R3/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a support supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate in a first direction, a biasing unit configured to bias the support in the first direction with respect to the rigid substrate, and a contactor provided on a protruding portion of the flexible substrate, the protruding portion being protruded with respect to the rigid substrate. The contactor includes a contact housing, and a probe supported on the contact housing. One end of the probe is in contact with a contact portion on the protruding portion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.