Localization, mapping and haptic feedback for inspection of a confined space in machinery
US10712391B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 2017 |
| Grant date | Jul 14, 2020 |
| Priority date | — |
| Expiry date | Jul 10, 2038 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S901/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A modular device is used to inspect a confined space in a machine. The entire inspection coverage area and corresponding status are mapped so that the inspection location and associated data are graphically visualized. An accelerometer mounted on the device serves as a tilt sensor and also provides data about a collision of the device with the space being inspected or defects therein. The accelerometer data in combination with an odometry system determines the axial position of the device. A gyroscope mounted on the device is used to determine the device heading. The locational information is used to generate an inspection map that provides inspection history, logged data and a reference that are useful in scheduling the next inspection. The output of the gyroscopes can be used to provide haptic feedback to the device operator to maintain proper device orientation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.