Failure prediction apparatus for electric device and failure prediction method using the same
US10713580B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 9, 2017 |
| Grant date | Jul 14, 2020 |
| Priority date | — |
| Expiry date | Apr 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided is a failure prediction method using a failure prediction apparatus, including: receiving time-series data about measured performance parameters from a device under test; encoding the time-series data with a plurality of symbols corresponding to a predetermined range; calculating a transition probabilities between the symbols of the encoded time-series data, and generating a transition matrix according to the transition probabilities; calculating an abnormal indicator, which is a difference between the transition matrix and a pre-stored database, and an increased value of the abnormal indicator; and comparing the increased value of the abnormal indicator and a predetermined threshold value, and if the increased value of the abnormal indicator is greater than the predetermined threshold value, predicting that failure of the device under test is to occur.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.