Method and system for using machine-learning for object instance segmentation
US10713794B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2018 |
| Grant date | Jul 14, 2020 |
| Priority date | — |
| Expiry date | Dec 7, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment, a method includes a computing system accessing a training image. The system may generate a feature map for the training image using a first neural network. The system may identify a region of interest in the feature map and generate a regional feature map for the region of interest based on sampling locations defined by a sampling region. The sampling region and the region of interest may correspond to the same region in the feature map. The system may generate an instance segmentation mask associated with the region of interest by processing the regional feature map using a second neural network. The second neural network may be trained using the instance segmentation mask. Once trained, the second neural network is configured to generate instance segmentation masks for object instances depicted in images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.