Patent · US Active

Device for measuring radiation backscattered by a sample and measurement method using such a device

US10718709B2 · kind B2 · utility

0Cited by

5References

12Claims

0Family size

Assignee

COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES · FR

Inventors

Nils Petitdidier · Grenoble, FR
Selimen Benahmed · Grenoble, FR
Anne Koenig · Meylan, FR

Key dates

Filing date	Dec 20, 2018
Grant date	Jul 21, 2020
Priority date	—
Expiry date	Dec 26, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/0626
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device for measuring radiation backscattered by a sample including:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.