Test probe and apparatus for testing printed circuit board
US10718807B2 · kind B2 · utility
0Cited by
2References
9Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Apr 11, 2018 |
| Grant date | Jul 21, 2020 |
| Priority date | — |
| Expiry date | Nov 24, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2805
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a test probe and an apparatus for testing a printed circuit board, wherein the test probe comprises a test pin; and an insulating protection sleeve with adhesive attached therein, wherein the insulating protection sleeve is sleeved on the test pin, and wherein a first end of the test pin protrudes from the insulating protection sleeve.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.