Method for mapping crop yields
US10719787B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 31, 2017 |
| Grant date | Jul 21, 2020 |
| Priority date | — |
| Expiry date | Oct 31, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/188
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
Systems and methods for generating crop yield maps are provided, in one example embodiment, a method can include accessing, by one or more processors, data indicative of crop yield for a field area; and accessing, by the one or more processors, one or more data types associated with the field area. Each of the data types can provide a geospatial distribution of data associated with vegetation across the field area. The method can further include determining, by the one or more processors, a crop yield distribution for the field area based at least in part on the data indicative of crop yield and the one or more data types; and generating, by the one or more processors, a yield map for the field area based at least in part on the crop yield distribution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.