Electromagnetic field measurement system
US10725078B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 28, 2016 |
| Grant date | Jul 28, 2020 |
| Priority date | — |
| Expiry date | Jul 17, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/0878
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In an electromagnetic field measurement system, a probe substrate and a transmission line substrate form a T-shaped structure, where the probe substrate forms a cap and the transmission line substrate forms a stem of the T-shaped structure. The probe substrate includes a probe having a first probe element, a second probe element, and a reference plane. The first probe element and the second probe element are disposed so that there is an axis of symmetry between these probe elements, whereby the axis of symmetry is perpendicular to the transmission line substrate. The transmission line substrate includes a transmission line structure coupled to the probe. The transmission line structure separately guides the first probe signal and the second probe towards a measurement processing arrangement that can provide a measurement results on the basis of the first probe signal and the second probe signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.