Automated test system having multiple stages

US10725091B2 · kind B2 · utility

Assignee

• Teradyne, Inc. · US

Inventors

• David Paul Bowyer · Littlehampton, GB
• Jianfa Pei · Haverhill, US
• John P. Toscano · Auburn, US
• Philip Campbell · North Reading, US
• Marc L. Smith · Sterling, US

Key dates

• Filing date: Aug 28, 2017
• Grant date: Jul 28, 2020
• Expiry date: May 9, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2868
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An example test system includes: a test rack including test slots; first and second shuttles that are configured to move contemporaneously to transport devices towards and away from trays, with at least some of the devices having been tested and at least some of the devices to be tested; first and second robots that are configured to move contemporaneously to move the devices that have been tested from test sockets in test carriers to the first and second shuttles, and to move the devices to be tested from the first and second shuttles to the test sockets in test carriers; and first and second test arms that are configured to move contemporaneously to move the test carriers between the first and second robots and the test rack.