Maintenance management systems and methods

US10725095B2 · kind B2 · utility

Assignee

• Fluke Corporation · US

Inventors

• John Neeley · Seattle, US
• Jordan Schlichting · New Hope, US
• Thomas J. McManus · Plymouth, US
• Peter A. Bergstrom · Windom, US
• Lindsey Berdan · Seattle, US
• Joseph V. Ferrante · Redmond, US
• Michael D. Stuart · Issaquah, US

Key dates

• Filing date: Aug 7, 2017
• Grant date: Jul 28, 2020
• Expiry date: Jul 27, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F11/2294
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system for measuring a device under test (DUT) includes a computing device and a measurement device that measures an electrical or physical parameter of the DUT. The computing device receives and stores measurement data in a DUT record associated with the DUT. The computing device further obtains a first image of the DUT, displays the first image as a reference image with a first reference frame, receives a live image of the DUT from an image sensor, and displays the live image with a second reference frame that corresponds to the first reference frame. A cursor on the live image moves according to movement of the image sensor relative to the DUT. A second image of the DUT is obtained, wherein the second image is substantially aligned with the reference image based on an alignment of the cursor with the second reference frame. The second image is stored in the DUT record.