Near-field measurement system and method for obtaining far-field characteristics
US10725168B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2017 |
| Grant date | Jul 28, 2020 |
| Priority date | — |
| Expiry date | Nov 27, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S13/66
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system is provided. The measurement system comprises a device under test comprising at least two signal paths, at least two measurement antennas being spatially separated in the near-field of the device under test, and a signal analysis unit. Whereas each of the at least two signal paths of the device under test comprises an antenna and a power amplifier, noise of the power amplifiers of the at least two signal paths of the device under test is not phase-coherent. In this context, the signal analysis unit is configured to perform at least two time-coherent measurements with the aid of the at least two measurement antennas with respect to the device under test in near-field. In addition to this, the signal analysis unit is further configured to calculate at least one signal characteristic, especially error vector magnitude and/or signal-to-noise ratio, in far-field on the basis of the at least two time-coherent measurements in the near-field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.