Dual-sensor tool optical data processing through master sensor standardization
US10725203B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 18, 2015 |
| Grant date | Jul 28, 2020 |
| Priority date | — |
| Expiry date | Apr 17, 2037 |
Classification
- Technology area (CPC E)Fixed Constructions
- CPC primaryE21B49/0875
- WIPO fieldCivil engineering
- WIPO sectorOther fields
Abstract
A method may include collecting measurement data using a first operational sensor and a second operational sensor of a downhole tool, standardizing optical responses of each operational sensor to a master sensor in a tool parameter space to obtain a standardized master sensor response, transforming the standardized master sensor response to a synthetic parameter space response of the master sensor, applying a fluid model with the synthetic parameter space response of the master sensor to predict a fluid characteristic, comparing a first prediction obtained with the fluid model from the first operational sensor with a second prediction obtained with the fluid model from the second operational sensor, determining a fluid characteristic from the first prediction and the second prediction, and optimizing a well testing and sampling operation according to the fluid characteristic.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.