Patent · US Active

Microscope system

US10725309B2 · kind B2 · utility

2Cited by

8References

20Claims

0Family size

Assignee

Canon Kabushiki Kaisha · JP

Inventors

Michiie Sakamoto · Tokyo, JP
Akinori Hashiguchi · Tokyo, JP
Shinobu Masuda · Tokyo, JP
Tsuguhide Sakata · Machida, JP
Masahide Hasegawa · Yokohama, JP
Masahiro Ando · Yokohama, JP
Osamu Nagatsuka · Kawasaki, JP

Key dates

Filing date	Dec 8, 2015
Grant date	Jul 28, 2020
Priority date	—
Expiry date	Sep 15, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG02B27/60
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A microscope system includes a microscope body, an XY stage mounted on the microscope body and including a stage configured to place a slide as an observation target and move in an X-axis direction and a Y-axis direction perpendicular to each other, and an XY two-dimensional scale plate fixed to the stage. The XY two-dimensional scale plate is provided with a first mark that provides axis information in the X-axis direction throughout a movable range of the stage in the Y-axis direction and a second mark that provides axis information in the Y-axis direction throughout a movable range of the stage in the X-axis direction, which are used to recognize X- and Y-coordinates of the stage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.