Patent · US Active

Inspection apparatus and inspection program

US10726556B2 · kind B2 · utility

1Cited by
5References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 26, 2018
Grant dateJul 28, 2020
Priority date
Expiry dateJul 11, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04N1/00063
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

An inspection apparatus for inspecting printed matter on which an image is formed, includes: a region extractor that extracts a first region, in which a character is formed, and a second region, in which the character is not formed, with reference to image forming image data used to form the image; and a defect detector that detects a defect in the first region and a defect in the second region in read image data obtained by reading the printed matter on which the image is formed by the image forming image data, wherein the defect detector includes: a first region defect detector that detects loss of a dot in the first region in the read image data; and a second region defect detector that detects presence of a dot with a density equal to or greater than a predetermined density in the second region in the read image data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.