Chip testing method and an apparatus for testing of a plurality of field emission light sources
US10728966B1 · kind B1 · utility
0Cited by
2References
16Claims
0Family size
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Key dates
| Filing date | Feb 8, 2018 |
| Grant date | Jul 28, 2020 |
| Priority date | — |
| Expiry date | Feb 8, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J63/04
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention generally relates to a method for operating a plurality of field emission light sources, specifically for performing a testing procedure in relation to a plurality of field emission light sources manufactured in a chip based fashion. The invention also relates to a corresponding testing system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.