Patent · US Active

Calibration of sensitivity and axial orthogonality for magnetometers

US10732233B2 · kind B2 · utility

0Cited by
6References
7Claims
0Family size

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Key dates

Filing dateApr 16, 2018
Grant dateAug 4, 2020
Priority date
Expiry dateAug 2, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V13/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A reduced-cost apparatus for calibrating the sensitivity and orthogonality of a triaxial magnetometer, and a method for adjusting the distance between the two coils of a Helmholtz coil and other related parameters are described herein. A method can include positioning a calibrated magnetometer within a mounting fixture between two coils of a Helmholtz coil, the two coils arranged in mutually parallel planes and separated by the radius of the Helmholtz coil, the mounting fixture mounted such that a position of the mounting fixture is adjustable along an axis orthogonal to the mutually parallel planes; adjusting the position of the mounting fixture over at least some of the positions and measuring the magnetic field at each position to generate a set of magnetic field measurements associated with the positions; and adjusting the first distance based on the first set of magnetic field measurements. Additional apparatuses, systems, and methods are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.