Systems and methods for enclosure alignment
US10732268B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 21, 2019 |
| Grant date | Aug 4, 2020 |
| Priority date | — |
| Expiry date | May 21, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/931
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods are provided for enclosure alignment. A light can be emitted from a light source. The light source can be integrated into an enclosure to be aligned onto a fixture. A light detector can detect the light emitted by the light source. A luminance of the light detected by the light detector can be measured. Based on the luminance, an extent of an alignment of the enclosure with respect to the fixture can be determined. The enclosure can be translated along the fixture based on the extent of the alignment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.