Patent · US Active

Systems and methods for enclosure alignment

US10732268B1 · kind B1 · utility

4Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 21, 2019
Grant dateAug 4, 2020
Priority date
Expiry dateMay 21, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S17/931
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems and methods are provided for enclosure alignment. A light can be emitted from a light source. The light source can be integrated into an enclosure to be aligned onto a fixture. A light detector can detect the light emitted by the light source. A luminance of the light detected by the light detector can be measured. Based on the luminance, an extent of an alignment of the enclosure with respect to the fixture can be determined. The enclosure can be translated along the fixture based on the extent of the alignment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.