Live metrology of an object during manufacturing or other operations
US10732284B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2017 |
| Grant date | Aug 4, 2020 |
| Priority date | — |
| Expiry date | Oct 29, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20212
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for live metrology of an object includes performing a scanning operation by a plurality of sensors to collect electronic images of an object. The electronic images include 3-D point cloud data for live metrology of the object and the point cloud data from each sensor define a point cloud that represents the object. The method also includes stitching the point clouds from the plurality of sensors to generate a reconstructed model of an as-manufactured object. The method further includes comparing the reconstructed model of the as-manufactured object to an as-designed model of the object to determine that the object is manufactured within an allowable tolerance to the as-designed model of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.