Ion mobility analyzer and analysis method
US10739308B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2018 |
| Grant date | Aug 11, 2020 |
| Priority date | — |
| Expiry date | Jun 15, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/4215
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides ion mobility analyzer and analysis method. The analyzer includes an ion source, a first drift/analyzer region provided with an ions entrance, a second drift/analyzer region provided with an ions exit, a connection region connecting the first drift/analyzer region and the second drift/analyzer region, and a detector connected to the ion exit. Direct current electric fields and gas flows in the first drift/analyzer region and the second drift/analyzer region apply opposing forces on ions, and first and second gas flows have the same gas flow direction. The connection region includes a third direct current electric field that causes ions to transfer from the first drift/analyzer region to the second drift/analyzer region. Because the first and second regions have the same gas flow direction, the invention achieves stable resolution and sensitivity as a high-resolution ion mobility analyzer and/or an ion mobility filter for a continuous ion beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.