Radiation inspection system and radiation inspection method
US10739491B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 26, 2018 |
| Grant date | Aug 11, 2020 |
| Priority date | — |
| Expiry date | Apr 19, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure discloses a radiation inspection system and a radiation inspection method. The radiation inspection system comprises a radiation source and a beam modulating device. The beam modulating device comprises a first collimating structure disposed at a beam exit side of the radiation source and a second collimating structure disposed at a beam exit side of the first collimating structure. The second collimating structure is movable relative to the first collimating structure to change a relative position of the first collimating port of the first collimating structure with the second collimating port of the second collimating structure, and the beam modulating device is shifted between a first operational state in which the beam modulating device modulates an initial beam into a fan beam, and a second operational state in which the beam modulating device modulates the initial beam into a pencil beam variable in position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.